CSU Short Course Registration Now Open
Posted: August 2nd, 2017
The CSU Short Course: X-ray Diffraction and Scattering Methods for Material Analysis registration is now open!
Are you interested in expanding your knowledge on how Xray diffraction or scattering can be used to analyze different types of materials? The CIF is hosting a Materials Analysis Short Course on September 14-15 during which students can learn and gain hands-on experience with different experimental approaches used in Xray diffraction/scattering techniques. Day 1 will focus on Xray diffraction for structural analysis while Day 2 will focus on Xray and dynamic light scattering for particle size distribution and molecular weight estimations.
A basic understanding of Xray diffraction and scattering is required in order to be able to follow the lectures and data interpretation covered by application scientists from CSU, Bruker, PANalytical, and Malvern. Take advantage of a unique opportunity offered by Bruker to have your samples analyzed for more advanced analysis prior to the workshop.
When: Sep 14-15, 2017
Where: Colorado State University
Fort Collins, CO 80523
Cost: CSU participants: $100/day
For updates on workshop details and registration please click here.
Registration cost is discounted for CSU students @ $100/day.
For more information, please contact:
Erin Stuckert Phone: 970-491-2670 E-mail: Erin.Stuckert@colostate.edu