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SUMMARY:High Spatial Resolution EDS Mapping And EBSD Analysis In An SEM.
LOCATION:Chemistry A101
TZID:America/Denver
DTSTART:20241022T160000
UID:2026-04-29-12-59-27@natsci.colostate.edu
DTSTAMP:20260429T125927
Description:About the Seminar:\n\nTraditional SEM-EDS analyses employ high 
 acceleration voltages with 20 kV being the standard along with longer work
 ing distances\; this limits the spatial resolution for EDS maps to around 
 30 to 50 nanometers and any further resolution improvements at those condi
 tions demand considerable effort. Low voltage SEM-EDS analysis combined wi
 th a reduced working distance helps minimize the interaction volume and ma
 tch the high resolution condition of the SEM. An alternative route to impr
 ove the spatial resolution of EDS maps entails using higher accelerating v
 oltage in conjunction with an electron transparent sample with STEM-SEM. T
 his presentation will review both low kV and 30 kV STEM-SEM modes for achi
 eving high resolution EDS maps in an SEM with an emphasis on applications 
 warranting such approaches. Further\, the treatment will be extended to im
 proving spatial resolution in EBSD analysis warranted for effective charac
 terization of nanocrystalline materials as well as of heavily deformed sam
 ples.\n\nLink to Virtual Viewing\n\nAbout the Speaker\n\nDr. Sonika Robert
 son is a Territory Sales Manager Oxford Instruments NanoAnalysis supportin
 g analytics for electron microscopes. She was awarded her B.S. and M.S. in
  Physics in 2010 from the University of Delhi and a Ph.D. in Mechanical En
 gineering from the University of Houston in 2018. Her doctoral research fo
 cused on mechanical and microstructural characterization of thermoelectric
  ceramics and reactively brazed metal-ceramic interfaces. Upon completion 
 of her doctorate\, she worked as a metallurgist and failure analysis engin
 eer at Schlumberger investigating downhole tools from drilling\, completio
 ns\, and production &amp\; intervention\, some of which involved losses of
  ~$1MM each incurred over a span of weeks to months and years. She then we
 nt on to manage the North America applications team for optical microscopy
  at Leica Microsystems before joining Oxford Instruments in 2022 and has o
 ver 15 years of hands-on experience in metallography and optical and elect
 ron microscopy. 4:00 pm
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