BEGIN:VCALENDAR
VERSION:2.0
PRODID:-//ZContent.net//ZapCalLib 1.0//EN
CALSCALE:GREGORIAN
METHOD:PUBLISH
BEGIN:VEVENT
SUMMARY:XRDynamic Seminar: Thin Film Structure and Thickness Analysis via G
 razing Incidence X-ray Diffraction and X-ray Reflectometry
LOCATION:Yates 102/103 and Teams
TZID:America/Denver
DTSTART:20260610T110000
UID:2026-08-12-19-22-37@natsci.colostate.edu
DTSTAMP:20260812T192237
Description:Please register to attend: https://www.research.colostate.edu/
 arc/seminars-workshops/\n\nTeams link\n\n&nbsp\;\n\nSeminar Abstract:\n\nA
 s thin films and coatings become increasingly central to advanced manufact
 uring\, reliable\, non-destructive characterization is essential for proce
 ss control\, product qualification\, and failure analysis. This talk will 
 review two highly practical X-ray techniques for thin film characterizatio
 n: grazing-incidence X-ray diffraction (GIXRD) and X-ray reflectivity (XRR
 ) on the XRDynamic 500 available at the ARC. GIXRD provides phase identifi
 cation\, preferred orientation and crystallite size information in thin fi
 lms and multilayers\, while XRR delivers fast\, quantitative measurements 
 of film thickness\, density\, and interface roughness. Together\, these me
 thods offer complementary structural and physical information that is crit
 ical for optimizing deposition processes and validating material performan
 ce across semiconductor\, coating\, energy\, and functional materials appl
 ications. The presentation will showcase how measurement geometry influenc
 es sensitivity\, what information can be extracted reliably from each tech
 nique\, and how to translate data into actionable decisions for production
  and development environments. We will also highlight the XRDynamic 500\\'
 s capabilities\, limitation and measurement modes for GIXRD and XRR.11:00 
 am
END:VEVENT
END:VCALENDAR