Please register to attend: https://www.research.colostate.edu/arc/seminars-workshops/
Seminar Abstract:
As thin films and coatings become increasingly central to advanced manufacturing, reliable, non-destructive characterization is essential for process control, product qualification, and failure analysis. This talk will review two highly practical X-ray techniques for thin film characterization: grazing-incidence X-ray diffraction (GIXRD) and X-ray reflectivity (XRR) on the XRDynamic 500 available at the ARC. GIXRD provides phase identification, preferred orientation and crystallite size information in thin films and multilayers, while XRR delivers fast, quantitative measurements of film thickness, density, and interface roughness. Together, these methods offer complementary structural and physical information that is critical for optimizing deposition processes and validating material performance across semiconductor, coating, energy, and functional materials applications. The presentation will showcase how measurement geometry influences sensitivity, what information can be extracted reliably from each technique, and how to translate data into actionable decisions for production and development environments. We will also highlight the XRDynamic 500’s capabilities, limitation and measurement modes for GIXRD and XRR.
